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Expansion Of Surface Analysis Capabilities At MSSI


Expansion of Surface Analysis Capabilites at MSSIIn February 2015, MSSI launched a campaign to inform existing and potential new clients of the expansion of the Surface Analysis Capabilities in the Institute. A state-of-the-art Imaging X-ray Photoelectron Spectrometer (XPS) and Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS) have recently been added to the existing Surface Analysis Lab with further capabilities to carry out Auger Electron Spectroscopy (AES), Scanning Auger Microscopy (SAM) and Secondary Electron Microscopy (SEM) and organic/inorganic depth profiling with the novel Argon Gas Cluster Ion Source. The facility is supported by two highly qualified instrument scientists. Industry users of the facility have included Cook Medical, Boston Scientific, Element Six and Abbott Nutrition Ireland.