Anaolog Devices produce electronic components which can fail for a variety of reasons. However, there is some experimental evidence suggesting that the components never fail before some threshold time, i.e., the components are guaranteed to have a lifetime which is greater than this threshold.
Knowledge of a threshold time is useful in practice: it provides insight into the physical properties of the component (especially its failure mechanisms). Therefore, methods for establishing the existence (or non-existence) of such a threshold are useful in practice.
Some questions of interest are as follows:
It is anticipated that the answers to these questions can be found through a mixture of numerical simulations and literature review. Some real experimental data will also be made available.
Aside from statistical considerations described above, a mathematical model / stochastic process for individual failure mechanisms will also be useful to help establish the existence of such a threshold time based on fundamental physical properties.